Inline Characterization of Industrial Paper Coatings
Modern paper manufacturing relies heavily on specialized coatings to deliver functionality and surface quality tailored to the end use. NLIR’s MIDWAVE Spectrometer enables manufacturers to track coating composition, thickness consistency and structure in real time on production lines, ensuring stability of high-speed industrial processes to reduce waste, secure product quality, and enable new high-value applications.
Key capabilities for coated paper applications:
- Real-time curing quality verification for Si layers
- Monitoring of binder-to-pigment ratios
- Barrier coatings verification
- Moisture and binder content analysis
- Thickness and uniformity verification
- Defect and irregularity detection
By enabling inline coating characterization at production speeds, the MIDWAVE Spectrometer supports tighter process control, reduced energy and chemical consumption, and faster qualification of new coating formulations. This makes it a key tool for industrializing advanced paper products and staying competitive in high-performance packaging and specialty paper markets.
IMPROVE CHARACTERIZATION OF PAPER COATINGS
Live Monitoring
400 Hz full-spectrum readout rate enables real-time insights
High Sensitivity
130 k counts/(ms µW) with non-contact measurements
OEM Ready
Can be mounted in production environments and support QA/QC
Excellent Service
Support for your specific application requirements
How does it work?
This demo showcases how fast MIDWAVE Spectrometer is able to acquire spectral information of different coatings on paper, demonstrating the potential for in-line Quality Assurance / Quality Control.
Here, 4 different paper samples are rotating in a sample wheel that spins at the speed of 60 rounds per minute (RPM) capturing coating information. Using these spectral insights, we are able to identify the material, coating thickness, chemistry, and performance at industrial speed, and deliver lab-grade insight to the inline production.
Monitor paper coatings' quality in real time with our REFLECTION Measurement System
REFLECTION Measurement System combined with
MIDWAVE Spectrometer
Readout full reflection spectra in milliseconds
REFLECTION Measurement System combined with
REFLECTION Interface
Reflection system that can be tailored to your setup
REFLECTION Measurement System combined with
TOUCH Interface
Get reflection measurements from a sample of any shape or texture
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Analyzing Different Coatings on Paper – Measurement Case
We have performed mid-infrared reflection spectroscopy on four different paper samples: (1) normal paper, (2) glossy paper, (3) baking paper and (4) inside of a paper cup (for barrier layer). Even at high speed of the moving sample, MIDWAVE Spectrometer is able to capture the spectral signatures of each sample efficiently and we are able to distinguish between different paper coatings with simplicity.
Would you like to learn more about the analysis insights?
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Take the next step for inline paper characterization with NLIR
If you are looking to scale up paper coating characterization from offline, lab-based tests to an industrial level, our mid-infrared spectroscopy solutions can uplift your production line to new speed.
At NLIR, we offer cutting-edge mid-infrared spectrometers and interfaces tailored to the needs of your product quality inspection. If you have a specific measurement or would like to investigate our system installation in your paper-coating production line, please do not hesitate to contact us today.