Details
Setting up the optical interface to a sample can be time consuming. To simplify this process, NLIR offers a range of REFLECTION Measurement Systems to ease your measurement case. Each system includes NLIR’s MIDWAVE Spectrometer, Light Source, Software, and fibers — allowing you to plug in the devices and start measuring immediately.
There’s no one-size-fits-all solution for spectroscopic reflection measurements, as different samples require different interfaces. Over the years, NLIR has developed custom solutions and conducted extensive testing across various industries to carefully craft REFLECTION Measurement Systems. Our most effective and widely used systems are featured here below.
REFLECTION Measurement System with
TOUCH Interface
Perform non-destructive reflection measurements with TOUCH Interface
REFLECTION Measurement System with
PRECISION Interface
Perform precise small-area reflection measurements with PRECISION Interface
REFLECTION Measurement System with
REFLECTION Interface
Perform reflection measurements at an industrial scale with REFLECTION Interface
REFLECTION Measurement System with
SAMPLER Accessory
Perform reflection measurements from almost any surface with a high-power thermal light by collection light using the SAMPLER Accessory
Choose the best Reflection Measurement System for your needs
Measurements done in reflection from a given sample needs a powerful light source and a means to get the reflected light to the spectrometer.
NLIR has designed various REFLECTION Measurement Systems for efficient measurements of various samples. It include, but is not limited to, measurement of black plastics, coated metal plates or reflective optics.
Are you interested in any of the REFLECTION Measurement Systems? Submit your inquiry today.
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Each REFLECTION Measurement System consists of:
MIDWAVE Spectrometer
FIBER or AURALIS or none Light Source, based on the system requirements
Interface or Accessory of your choice (choose from the drop-down list)
MIRFIBER mid-infrared fiber(s) based on the system requirements
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How to pick the right Optical Interface for your measurement needs?
The key to a successful optical characterization setup is by ensuring that infrared light interacts with the sample in a way that brings the most amount of light with the most amount of information to the detector. For example, a metallic mirror reflects a lot of light so as a sample it gives a high signal but little information about the mirror substrate because the light never enters beyond the front surface of the mirror. That is why you should be using REFLECTION Measurement System. On the other hand, a piece of black plastic measured in transmission will give insufficient light for the detector, however a small amount of light that makes it through carries a lot of information about the plastic. That is why you should refer to TRANSMISSION Measurement System.
While considering the right interface for your measurement needs, you need to take into account several factors. Below we provide a few examples where REFLECTION Measurement System with particular interface would help you achieve the best measurement results based on your sample.
Coated Metal characterization with REFLECTION Interface
Steel coils or plates are often highly reflective, so a coating is easily measured in reflection with both significant signal and lots of information. The challenge for this sample is that it is most often large so measurements most be done fast to cover the largest possible area in a given time. This can best performed with REFLECTION Interface integration at your production line.
Integrated Optics Measurements with PRECISION Interface
Many components on integrated devices either have infrared properties or can be characterized by infrared radiation. Important for this kind of sample is that only a comparatively small area is measured. Optical fibers are very useful to bring light to and from a small sample and onward to a spectrometer. NLIR has developed PRECISION Interface for exactly this purpose.
Black Plastic Sorting with TOUCH Interface
This sample is usually too thick for transmission and must be measured in reflection. Reflection measurements are often very sensitive to the surface roughness and the amount of reflected light can vary significantly. However, the reflected light holds a lot of information. You can achieve outstanding data acquisition results with NLIR TOUCH Interface regardless of the surface properties.
Powder Measurements with SAMPLER Accessory
Measuring the infrared properties of a sample in powder form is notoriously difficult because light is scattering upon interaction. There’s no standardized way of performing this task but NLIR has had some success with measurements in reflection. Low amount of light is returned from a powder sample using SAMPLER Accessory.
