From Averages to Real-Time Insights - Capture Every Micro-Event
Are you seeking more accurate and detailed insights in your quality control or R&D processes? While traditional Fourier Transform Infrared (FTIR) spectroscopy has been a reliable method for mid-infrared analysis, it inherently relies on averaging measurements, often obscuring critical micro-events. NLIR’s cutting-edge mid-infrared spectrometers enhances the measurement capabilities by capturing every single micro-event, significantly improving your ability to detect subtle changes instantly.
Averaging in Conventional FTIR Spectroscopy
In typical FTIR spectrometers, averaging multiple scans is a fundamental practice aimed at increasing the signal-to-noise ratio. While this technique does help reduce noise and enhance the general clarity of spectral data, it comes with inherent drawbacks:
- Loss of Critical Detail. Averaging can conceal transient or micro-scale events, leading to missed opportunities in data monitoring for critical research.
- Time Consuming. Accumulating multiple scans to reach desired accuracy extends the measurement time, decreasing throughput, especially in speed-critical production environments.
- Limited Sensitivity. Low-intensity signals or rapidly changing samples can be inadequately captured by averaging, resulting in less reliable conclusions.
Capturing Every Micro-Event with NLIR Technology
Unlike conventional systems, our mid-infrared spectrometers are engineered to precisely detect every micro-event without the need for averaging. The heart of NLIR’s technology is our innovative approach to mid-IR spectroscopy, upconverting mid-infrared signals into near-visible wavelengths. This allows detection by high-efficiency sensors with significantly lower noise and faster response time than traditional mid-infrared detectors.
Benefits of capturing every micro-event include:
- Enhanced Sensitivity. Our technology achieves a noise-equivalent power (NEP) as low as 10 fW/√Hz, enabling detection of ultra-subtle spectral variations.
- Unmatched Speed. With acquisition rates up to 130 kHz, NLIR spectrometers provide real-time insights, perfectly suited for high-speed production lines and dynamic R&D environments.
- Immediate Data Reliability. By removing averaging, every measurement reflects the true nature of the event, essential for processes where fast decision making is required.
Comparison: Conventional FTIR vs NLIR Mid-Infrared Spectroscopy
For additional details, explore our spectroscopic measurements and learn why NLIR technology is the fastest alternative to FTIR spectroscopy.
Real-World Impact: Micro-Event Capture Across Applications
The benefits of capturing every micro-event, rather than relying on averaged data, are already being realized in a range of demanding environments. Below, we highlight a few concrete examples of the many possibilities. If your challenge isn’t listed, our team is ready to help you explore how NLIR technology can fit your needs.
Inline Plastic Sorting
Sorting plastics is a fast-moving operation, especially while recycling plastic waste where there is not enough time resources to invest. Missing a single anomaly on the conveyor can mean contamination of entire material streams, especially for black plastics. This is where real-time short signal spike capture changes the game. By delivering instant, detailed spectral data to AI classifiers, operators can respond to changes immediately – improving both the speed and purity of sorting.
“The MIDWAVE Spectrometer has become a primary instrument for our team’s fast, AI-based plastic waste characterization.”
— Dr. Stas Zinchik, Michigan Technological University
Broadband Trace Gas Detection
For laboratories and industrial monitoring, detecting trace gases quickly and reliably is a constant challenge. Traditional averaging can easily miss fleeting changes, especially when working with low concentrations or multiple gases at once. With NLIR’s technology, the environment is monitored in real time, enabling precise identification and faster responses.
“We achieved superior sensitivity and spectral range for fast, stable multi-species detection – performance made possible only by capturing every micro-event.”
— Prof. Frans Harren & Dr. Qing Pan, Radboud University
High-Speed Quality Control in Manufacturing
Whether it’s in semiconductor fabrication, optical coating production, or advanced material development, capturing every micro-event means that nothing is missed – even at the highest speed of the processes. Subtle defects, rapid process shifts, or sudden anomalies can all be identified as they happen, or be detected rapidly while passing through QC. This provides engineers and production teams with true real-time insight, supporting rapid decisions that maintain quality and reduce waste and downtime.
Why Capturing Every Micro-Event Matters
When you can see every micro-event as it occurs, you achieve a new level of control over your process. There’s no need to sacrifice time resolution for noise reduction, and no risk of missing critical details. The result is a workflow that’s more responsive, more efficient, and ultimately more reliable.
NLIR’s technology delivers:
- Immediate insight into even the fastest–paced processes,
- Exceptional sensitivity to subtle chemical and material changes,
- Confidence that every relevant event is recorded, not averaged.
Ready to Experience the Difference?
Are you interested in moving beyond traditional FTIR limitations? We invite you to explore our application areas or contact our team for a personalized consultation. Discover how NLIR’s approach to mid-infrared spectroscopy can support your success – no matter how complex or fast your process may be.
